GENETIC VARIABILITY FOR YIELD PARAMETERS AND SPOT BLOTCH RESISTANCE IN F2 POPULATION OF DURUM WHEAT (Triticum turgidum var durum)

C.K. CHETHANA¹*, V. RUDRANAIK^2
1Department of Genetics and Plant Breeding, University of Agriculture Sciences, Dharwad, 580 005, Karnataka
²Department of Genetics and Plant Breeding, University of Agriculture Sciences, Dharwad, 580 005, Karnataka
* Corresponding Author : ckcnanda608@gmail.com

Received : 26-11-2016     Accepted : 15-01-2017     Published : 12-02-2017
Volume : 9     Issue : 7       Pages : 3843 - 3845
Int J Agr Sci 9.7 (2017):3843-3845

Keywords : Area Under Disease Progress Curve (AUDPC), Genetic variability, Wheat, Spot blotch
Academic Editor : Dr. S. A. Desai
Conflict of Interest : None declared
Acknowledgements/Funding : The authors thankfully acknowledge the financial support from Department of Science and Technology (DST), India through DST-INSPIRE fellowship to PhD project to first author
Author Contribution : None declared

The experiment was conducted to study the extent of genetic variability for grain yield, its component traits and spot blotch in F2 population of the cross Bijaga yellowx NIDW-295. High phenotypic coefficient of variation (PCV) and genotypic coefficient of variation (GCV) were observed for all the characters except for days to fifty percent flowering, spike length and number of spikelet’s per spike. High heritability and genetic advance were recorded for all the characters except days to fifty percent flowering, awn length, spike length, number of spikelet’s per spike, thousand grain weight and seed yield per plant. These results suggested that better scope for selecting superior transgressive segregants in this population. For spot blotch incidence, high genetic coefficients of variation along with high heritability and genetic advance were recorded indicating the greater effectiveness of selection and improvement can be expected for spot blotch resistance. Present investigation suggests that selection in F2 population of Bijaga yellowx NIDW-295 will be effective in selecting superior plants for yield parameters and spot blotch resistance in evolving high yielding disease resistant genotype in wheat.